[1] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Osaki, "Formal Specification based Automatic Test Generation for Embedded Network Systems", Journal of Applied Mathematics, 2014(Article ID 909762), 21pages, May 2014.
[1] 安藤 崇央, 崔 銀惠, 西原 秀明, テスト仕様生成装置、テスト仕様生成方法、およびプログラム（特願2013-505910）, 2014年7月.
[1] Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --", Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, November 2011.
[1] Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and Osamu Mizuno, "SENS - Specification Language for Embedded Network Systems - toward Automatic Test Generation (Preliminary Version)", Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, 2011.
Copyright © 2025 omzn.aquatan.net a.k.a. Osamu Mizuno All rights reserved.
ここのリストで表示される文献は，SEL@KIT在籍者に関連するもののみになります．